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Test Sockets Use List │ Products & Services │ YAMAICHI ELECTRONICS

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Probe Card

Use List

Offering optimal solutions for diversified packages and test specifications with our design and production know-how cultivated with test burn-in sockets.

1-2（Total 2 Count）

高周波測定用スプリングプローブソケット

Socket with spring probe pins for high frequency measurement

Surface-mount socket for high frequency applications.
Y-shaped contact pins to support QFP and SOP.
Z-shaped contact pins to support QFN and SON. 
For details, please contact Yamaichi representative.

高周波測定用Y-シェイプ、Z-シェイプコンタクトソケット

Socket with Y-shape/ Z-shape contact for high frequency measurement

Surface-mount socket for high frequency applications.
Y-shaped contact pins to support QFP and SOP.
Z-shaped contact pins to support QFN and SON. 
For details, please contact Yamaichi representative.

　
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Burn-in Sockets
Test Sockets
Probe Card